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Content

  • Overview
  • Call for Papers
  • Important Dates
  • Instructions for Authors
    • Submission Guidelines
  • Welcome
  • Organizers
IAPR TC8 Workshop @ ICPR 2026

IAPR Workshop on Machine Vision for Industrial Inspection (MVI2)

Machine Vision for Industrial Inspection

August 17–22, 2026 | Lyon, France

The IAPR TC8 Workshop on Machine Vision for Industrial Inspection (MVI2) will be held together with the 28th International Conference on Pattern Recognition (ICPR).

📍 Location: Lyon, France
📅 Conference Dates: August 17–22, 2026

🔗 Conference Website: ICPR 2026

This workshop focuses on recent advances in machine vision for industrial inspection, including defect detection, quality monitoring, and AI-driven manufacturing systems.


Overview

Machine vision for industrial inspection is an important real-world application that drives advances in pattern recognition while addressing critical industrial needs. It plays a key role in automated quality control, defect detection, and intelligent manufacturing systems. Industrial inspection presents several unique challenges for pattern recognition research. Defect samples are often scarce, motivating research in few-shot learning and anomaly detection. High-consequence industrial decisions require reliable uncertainty estimation and explainable AI. At the same time, inspection systems often rely on multi-modal sensing, including visual, thermal, 3D, ultrasonic, and X-ray data, creating opportunities for research in sensor fusion. Manufacturing environments also introduce domain shifts due to variations in production processes and materials. This motivates advances in transfer learning and continual learning, enabling models to adapt to evolving industrial conditions. In addition, real-time inspection requirements drive research on efficient algorithms and edge computing architectures.

This workshop aims to bridge academic research and industrial deployment. It encourages discussion on scalable solutions, evaluation methods beyond standard metrics, and the development of benchmark datasets for industrial inspection tasks. By connecting researchers and practitioners, the workshop contributes to improving manufacturing competitiveness, product safety, infrastructure reliability, and sustainable zero-defect production.


Call for Papers

We invite submissions on topics including, but not limited to:

  • Deep Learning Architectures for Industrial Vision
  • Few-Shot and Zero-Shot Learning for Defect Recognition
  • Multi-Modal and Multi-Scale Pattern Analysis
  • Texture and Surface Pattern Analysis
  • 3D Vision and Geometric Pattern Recognition
  • Explainable and Interpretable Pattern Recognition
  • Transfer Learning and Domain Adaptation
  • Pattern Recognition for Non-Destructive Testing
  • Real-Time Vision Systems and Optimization
  • Novel Pattern Recognition Paradigms
  • Benchmark Datasets and Evaluation Metrics
  • Emerging Applications and Case Studies

Important Dates

Event Date
Paper submission May 15, 2026
Notification June 1, 2026
Camera-ready June 18, 2026
Workshop date August 21, 2026 (Friday); 13:30-17:30

Instructions for Authors

Submission Guidelines

Authors are invited to submit original contributions that have not been previously published and are not under review elsewhere. All manuscripts must be written in English and prepared using the official conference templates. Submissions will be evaluated through a single-blind peer-review process. More details on the submission process can be found on the official ICPR 2026 conference website: https://icpr2026.org/instructions.html.

Proceedings & Publication

The workshop proceedings will be published in the Lecture Notes in Computer Science (LNCS) series by Springer. Authors must format their papers according to the official LNCS guidelines.

Template downloads:

  • Word template (.docx)

  • LaTeX template

Page Limits

  • Maximum paper length: 15 pages, including references, figures and tables.

Submission System

Papers must be submitted through the Microsoft CMT submission system, which is used to manage the peer-review process. The Microsoft CMT service is provided free of charge by Microsoft, including infrastructure and technical support.

Registration Requirement

For each accepted paper, at least one author must register for the conference and present the work. Registration detail can be found on the official ICPR 2026 conference website.

Acknowledgement

The Microsoft CMT service is used for managing the submission and peer-review process for this workshop held in conjunction with ICPR 2026 under the International Association for Pattern Recognition (IAPR).


Welcome

We warmly welcome your participation and look forward to your contributions.

More information:
https://www.icpr2026.org

If you have any questions, please feel free to contact the workshop organizers.


Organizers

  • IAPR Technical Committee 8 (TC8)
    • Dr. Zheng Liu (Chair, The University of British Columbia)
    • Dr. Hiroyuki Ukida (Co-Chair, Tokushima University)
    • Dr. Ling Bai (TC8 Secretary, The University of British Columbia)

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